Nano Measure 2012 - June 19 – 20, 2012 - Palo Alto, CA

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Nano Measure 2012 - June 19 – 20, 2012 - Palo Alto, CA

Date: June 19 - 20, 2012
Location: Stanford University, Palo Alto, California, USA

Agilent Technologies is pleased to announce that the second Nano Measure scientific symposium will take place June 19 – 20 at Stanford University in Palo Alto, California!

Nano Measure 2012 will feature some of the most prestigious scientists in their respective fields presenting leading-edge, nanomeasurement-driven research.

The inaugural Nano Measure symposium (Poland, 2010) drew tremendous interest, boasting 149 international registrants. In addition to 34 oral presentations, 62 scientific posters were displayed.

Keynote speaker:
Prof. Dr. Denis Fichou (Université Pierre et Marie Curie)

Session 1
In Situ Life Science Studies, Biomaterials & Single-Molecule Characterization at the Nanoscale
Session chair: S. Jeffrey Rosner, Ph.D. (Life Technologies Corporation)

Session 2
Films, Membranes & Materials for Renewable Energy
Session chair: Friedrich Prinz, Ph.D. (Stanford University)

Session 3
Nanomechanical Properties of Organic & Inorganic Materials
Session chair: Warren C. Oliver, Ph.D. (Nanomechanics, Inc.)

Session 4
Discovering & Exploring New Nanoscale Frontiers
Session chair: Christine Kranz, Ph.D. (University of Ulm)

For more information and registration please visit www.nano-measure.com

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