TESCAN Introduces the TIMA Mineralogy Solution

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TESCAN Introduces the TIMA Mineralogy Solution

TESCAN’s unique technology is based on a completely integrated EDX system that performs full spectrum imaging at very fast scan speeds

January 23, 2012 -- TESCAN, a world leading manufacturer of scanning electron microscopes and focused ion beam workstations has introduced the TESCAN Integrated Mineral Analyzer. TIMA, a fully automated, high throughput, analytical scanning electron microscope is designed specifically for the mining and minerals processing industry. The TIMA solution will address applications such as Mineral Liberation Analysis, process optimization, remediation, and search for precious metals and rare earths. TIMA measures modal abundance, size-by-size liberation, mineral association, and performs PGM search automatically on multiple samples of grain mounts and thin or polished sections.

TESCAN’s unique technology is based on a completely integrated EDX system that performs full spectrum imaging at very fast scan speeds. Image analysis in TIMA is performed simultaneously with SEM backscatter electron images and a suite of x-ray images. The level of hardware integration of the SEM and EDX allows for unprecedented acquisition speeds for fully automated data collection, resulting in fast, accurate, repeatable and reliable results.

TESCAN is a leading provider of scientific instrumentation. Established in 1991, TESCAN is an ISO certified company with a long tradition of excellence in scanning electron microscopy.

www.tescan.com

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