Sitemap Contact Newsfeed in RSS/RDF-Format Follow us on Twitter Visit us on Facebook Connect us in LinkedIn
Statistics
Online:42 Visitors
Today: 1168
Yesterday: 3093
Total: 2001138

Sponsors

Leica Microsystems

J & M Analytik AG

Applied Scientific Instrumentation

Lumencor, Inc.

MetaMorph Software

QBC Diagnostigs

North89.com

CRAIC Technologies, Inc.

Märzhäuser Wetzlar stands for precision and quality

JENOPTIK


Newsletter

Contact
  
    Internet Agency
    200 Barnes Lane
    Branson, MO 65616 - USA
     info@microscopy-news.com


Find us on Facebook



Welcome to Microscopy-News.com
News


Sponsors



Yikes! NIST Sensor Measures Yoctonewton Forces Fast

August 31, 2010 - Physicists at the National Institute of Standards and Technology (NIST) have used a small crystal of ions (electrically charged atoms) to detect forces at the scale of yoctonewtons. Measurements of slight forces—one yoctonewton is equivalent to the weight of a single copper atom on Earth—can be useful in force microscopy, nanoscale science, and tests of fundamental physics theories.

A newton is already a small unit: roughly the force of Earth's gravity on a small apple. A yoctonewton is one septillionth of a newton (yocto means 23 zeros after the decimal place, or 0.000000000000000000000001).

Measurements of vanishingly small forces typically are made with tiny mechanical oscillators, which vibrate like guitar strings. The new NIST sensor, described in Nature Nanotechnology,* is even more exotic—a flat crystal of about 60 beryllium ions trapped inside a vacuum chamber by electromagnetic fields and cooled to 500 millionths of a degree above absolute zero with an ultraviolet laser. The apparatus was developed over the past 15 years for experiments related to ion plasmas and quantum computing.


The NIST force sensor is a crystal of ions (charged atoms) trapped inside the upper region of the copper cylinder. A laser beam directed upward through the trap cools the ions. A force is applied in the form of oscillating electric field, and a detector (not shown) measures the light reflected off the ions. Credit: Bollinger/NIST

In this case, it was used to measure yoctonewton-scale forces from an applied electric field. In particular, the experiment showed that it was possible to measure about 390 yoctonewtons in just one second of measurement time, a rapid speed that indicates the technique's high sensitivity. Sensitivity is an asset for practical applications.

The previous force measurement record with this level of sensitivity was achieved by another NIST physicist who measured forces 1,000 times larger, or 500 zeptonewtons (0.0000000000000000005 newtons) in one second of measurement time using a mechanical oscillator.** Previous NIST research indicated that a single trapped ion could sense forces at yoctonewton scales but did not make calibrated measurements. ***

The ion sensor described in Nature Nanotechnology works by examining how an applied force affects ion motion, based on changes in laser light reflected off the ions. A small oscillating electric field applied to the crystal causes the ions to rock back and forth; as the ions rock, the intensity of the reflected laser light wobbles in sync with the ion motion. A change in the amount of reflected laser light due to the force is detectable, providing a measure of the ions' induced motion using a principle similar to the one at work in a police officer's radar gun. The technique is highly sensitive because of the low mass of the ions, strong response of charged particles to external electric fields, and ability to detect nanometer-scale changes in ion motion.

The research was funded in part by the Defense Advanced Research Projects Agency. The first author, M.J. Biercuk, did the work as a post-doctoral researcher at NIST and is now at the University Sydney in Australia. Co-author H. Uys did the work as a NIST guest researcher and has since returned to the Council for Scientific and Industrial Research, Pretoria, South Africa.

* M.J. Biercuk, H. Uys, J.P. Britton, A.P. VanDevender and J. J. Bollinger. Ultrasensitive force and displacement detection using trapped ions. Nature Nanotechnology. Posted online Aug. 22, 2010.

** J.D. Teufel, T. Donner, M.A. Castellanos-Beltran, J.W. Harlow and K.W. Lehnert. Nanomechanical motion measured with an imprecision below that at the standard quantum limit. Nature Nanotechnology 4, 820–823.

*** See TechBeat article "NIST Develops Novel Ion Trap for Sensing Force and Light," NIST Tech Beat, June 30, 2009, at www.nist.gov/public_affairs/techbeat/tb2009_0630.htm#trap

Source: The National Institute of Standards and Technology (NIST)


www.nist.gov








generate PDF File  generate PDF File Print  Print


More News:
» Linkam temperature controlled probe stage used in conjunction with Raman microscopy at RMIT, Melbourne, Australia
» Sharp live images from the mouse brain
» Xmark Media, in association with Imperial College, announces Photonex London- photonics technology roadshow: the first in a series of FREE regional events focusing on applications of photonics
» GE Healthcare announces the winners of the 2011 IN Cell Analyzer Image competition
» Mac microscopy software looking for interested hardware vendors
Home Contact Imprint Sitemap